TCAD simulation of radiation-induced leakage current in SDRAM

Hoang Nguyen (1, 2) , Axel Rodriguez (3) , Frédéric Wrobel (2, 1) , Alain Michez (1, 2) , Francoise Bezerra (4) , Nathalie Chatry (5)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 Syrlinks (FRANCE)
4 CNES - Centre National d’Études Spatiales [Paris]
5 TRAD [Labège]

Domaines: Electronique

Hoang Nguyen, Axel Rodriguez, Frédéric Wrobel, Alain Michez, Francoise Bezerra, et al.. TCAD simulation of radiation-induced leakage current in SDRAM. 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark. ⟨hal-02086412⟩