Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics
Résumé
Vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analyzed. The tested parts include analog, linear, digital, and hybrid devices.
Mots clés
Temperature sensors
Particle beams
MOSFET
Registers
Protons
particle accelerators
radiation hardening (electronics)
radiation-induced effects
candidate particle accelerator electronics
particle accelerators electronics
single event effects
total ionizing dose
displacement damage
analog devices
linear devices
digital devices
hybrid devices