Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies - Archive ouverte HAL Access content directly
Journal Articles IEEE Transactions on Nuclear Science Year : 2010

Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies

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https://hal.science/hal-01632367

Submitted on : Friday, November 10, 2017-10:09:57 AM

Last modification on : Tuesday, January 23, 2024-12:28:53 PM

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hal-01632367 , version 1 (10-11-2017)

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M. Gedion, Frédéric Wrobel, Frédéric Saigné, R. D. Schrimpf, J. Mekki. Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies. IEEE Transactions on Nuclear Science, 2010, ⟨10.1109/TNS.2010.2085446⟩. ⟨hal-01632367⟩

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