Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies

M. Gedion (1) , Frédéric Wrobel (1, 2) , Frédéric Saigné (1, 2) , R. D. Schrimpf (3) , J. Mekki (4)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 Vanderbilt University [Nashville]
4 CERN - European Organization for Nuclear Research

Domaines: Electronique

M. Gedion, Frédéric Wrobel, Frédéric Saigné, R. D. Schrimpf, J. Mekki. Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies. IEEE Transactions on Nuclear Science, 2010, ⟨10.1109/TNS.2010.2085446⟩. ⟨hal-01632367⟩