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Journal Articles Applied Physics Letters Year : 2008

Effects of atmospheric neutrons and natural contamination on advanced microelectronic memories

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Electronics
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hal-01630029 , version 1 (07-11-2017)

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Frédéric Wrobel, J. Gasiot, Frédéric Saigné, Antoine Touboul. Effects of atmospheric neutrons and natural contamination on advanced microelectronic memories. Applied Physics Letters, 2008, 93 (6), ⟨10.1063/1.2971203⟩. ⟨hal-01630029⟩
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