On-Line Monitoring of Random Number Generators for Embedded Security - Archive ouverte HAL Access content directly
Conference Papers Year : 2009

On-Line Monitoring of Random Number Generators for Embedded Security

Abstract

Many embedded security chips require a high- quality Random Number Generator (RNG). Unfortunately, hard- ware RNG randomness can vary in time due to implementation defects or certain kinds of attacks. To overcome this issue, this paper presents the implementation of a battery of statistical test for randomness. The battery is selected for its efficient imple- mentation, making the area and power consumption insignificant. Performance and cost of the hardware implementation are given for FPGA and VLSI targets. Results show that statistical tests can easily be implemented in low-cost embedded security circuits and can enhance on-line monitoring of RNG randomness to prevent RNG failures.
Fichier principal
Vignette du fichier
Santoro09.pdf (120.57 Ko) Télécharger le fichier
Origin : Publisher files allowed on an open archive
Loading...

Dates and versions

inria-00446036 , version 1 (11-01-2010)

Identifiers

Cite

Renaud Santoro, Olivier Sentieys, Sébastien Roy. On-Line Monitoring of Random Number Generators for Embedded Security. IEEE International Symposium on Circuits and Systems, ISCAS 2009, May 2009, Taipei, Taiwan. ⟨10.1109/ISCAS.2009.5118446⟩. ⟨inria-00446036⟩
215 View
772 Download

Altmetric

Share

Gmail Facebook X LinkedIn More