A HEMT-Based Cryogenic Charge Amplifier with sub-100 eVee Ionization Resolution for Massive Semiconductor Dark Matter Detectors
Résumé
We present the measured baseline ionization resolution of a HEMT-based cryogenic charge amplifier coupled to a CDMS-II detector. The amplifier has been developed to allow massive semiconductor dark matter detectors to retain background discrimination at the low recoil energies produced by low-mass WIMPs. We find a calibrated baseline ionization resolution of σE=91eVee . To our knowledge, this is the best direct ionization resolution achieved with such massive ( ≈ 150 pF capacitance) radiation detectors.
Mots clés
HEMT amplifiers
Dark Matter detectors
Analogue electronic circuits
Frontend electronics for detector readout
Dark matter detectors
Front-end electronics for detector readout
dark matter: detector
amplifier: design
noise
background: electromagnetic
performance
energy resolution
cryogenics
semiconductor detector
electronics: readout