PROJECTION BASED APPROACH FOR REFLECTION SYMMETRY DETECTION
Résumé
A novel method for reflection symmetry detection is addressed using a projection-based approach that allows to deal effectively with additional noise, non-linear deformations, and composed shapes that are not evident for classic contour-based approaches. A new symmetry measure is also proposed to measure how good the detected symmetry is. Experiments validate the interest of our proposed method.
Origine : Fichiers produits par l'(les) auteur(s)
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