Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods

Fabio Benevenuti (1) , Fabiano Libano (1) , Vincent Pouget (2, 3) , Fernanda Lima Kastensmidt (4) , Paolo Rech (4)

1 UFRGS - Universidade Federal do Rio Grande do Sul [Porto Alegre]
2 IES - Institut d’Electronique et des Systèmes
3 RADIAC - Radiations et composants
4 PGMICRO - PgMicro - Instituto de Informática [UFRGS]

Domaines: Micro et nanotechnologies/Microélectronique; Electronique

Fabio Benevenuti, Fabiano Libano, Vincent Pouget, Fernanda Lima Kastensmidt, Paolo Rech. Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods. 31st Symposium on Integrated Circuits and Systems Design, Aug 2018, Bento Gonçalves, Brazil. ⟨hal-02088936⟩