Localization of 1/f noise sources in Si/SiGe:C HBTs

Marcelino Seif (1, 2) , Fabien Pascal (1, 2) , Bruno Sagnes (1, 2) , J. Elbeyrouthy (1, 2) , Alain Hoffmann (1, 2) , S. Haendler (3) , Pascal Chevalier (3) , Daniel Gloria (4)

1 IES - Institut d’Electronique et des Systèmes
2 M@CSEE - Micro électronique, Composants, Systèmes, Efficacité Energétique
3 ST-CROLLES - STMicroelectronics [Crolles]
4 STMicroelectronics

Domaines: Sciences de l'ingénieur [physics]; Micro et nanotechnologies/Microélectronique

Marcelino Seif, Fabien Pascal, Bruno Sagnes, J. Elbeyrouthy, Alain Hoffmann, et al.. Localization of 1/f noise sources in Si/SiGe:C HBTs. 8th International Conference on Unsolved Problems on Noise - UPON 2018, Jul 2018, Gdansk, Poland. ⟨hal-02053263⟩