Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions

J.-M. Palau (1) , G. Hubert (1) , K. Coulié (2) , B. Sagnes (1) , M.-C. Calvet , S. Fourtine

1 CEM2 - Centre d'Electronique et de Micro-optoélectronique de Montpellier
2 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Domaines: Physique [physics]; Sciences de l'ingénieur [physics]; Micro et nanotechnologies/Microélectronique

J.-M. Palau, G. Hubert, K. Coulié, B. Sagnes, M.-C. Calvet, et al.. Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions. IEEE Transactions on Nuclear Science, 2001, 48 (2), pp.225-231. ⟨10.1109/23.915368⟩. ⟨hal-02024841⟩