Imaging the electric properties of InAs∕InP(001) quantum dots capped with a thin InP layer by conductive atomic force microscopy: Evidence of memory effect - Archive ouverte HAL Access content directly
Journal Articles Applied Physics Letters Year : 2006

Imaging the electric properties of InAs∕InP(001) quantum dots capped with a thin InP layer by conductive atomic force microscopy: Evidence of memory effect

K. Smaali
  • Function : Author
M. Troyon
  • Function : Author
A. El Hdiy
  • Function : Author
M. Molinari
  • Function : Author
No file

Dates and versions

hal-01939907 , version 1 (29-11-2018)

Identifiers

  • HAL Id : hal-01939907 , version 1

Cite

K. Smaali, M. Troyon, A. El Hdiy, M. Molinari, Guillaume Saint-Girons, et al.. Imaging the electric properties of InAs∕InP(001) quantum dots capped with a thin InP layer by conductive atomic force microscopy: Evidence of memory effect. Applied Physics Letters, 2006, 89 (11), pp.112115. ⟨hal-01939907⟩
14 View
0 Download

Share

Gmail Facebook X LinkedIn More