Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser (1) , Viyas Gupta (2) , Georgios Tsiligiannis (2) , Arto Javanainen (3) , Heikki Kettunen , Helmut Puchner , F. Saigné (4, 5) , Ari Virtanen (6) , Frédéric Wrobel (4, 5) , Luigi Dilillo (2)

1 TEST - Test and dEpendability of microelectronic integrated SysTems
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
3 JYU - University of Jyväskylä
4 IES - Institut d’Electronique et des Systèmes
5 RADIAC - Radiations et composants
6 TUT - Tampere University of Technology [Tampere]

Various failure scenarios may occur during irradiation testing of SRAMs, which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

Mots clés: MCU; SRAM; Cross section; SEU cluster

Domaines: Electronique

Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩. ⟨hal-01932433⟩