Electromagnetic Susceptibility of low frequency bipolar transistors subject to the total ionizing dose effect

Adrien Doridant (1, 2) , Jérémy Raoult (1, 2) , Amable Blain (1, 2) , Sylvie Jarrix (1, 2) , Laurent Dusseau (3) , Nathalie Chatry , Patrick Hoffmann (4) , Philippe Calvel (5)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 CSU - Centre Spatial Universitaire de Montpellier-Nîmes
4 CEG - Centre d'étude de Gramat
5 TAS - Thales Alenia Space [Toulouse]

Domaines: Electronique

Adrien Doridant, Jérémy Raoult, Amable Blain, Sylvie Jarrix, Laurent Dusseau, et al.. Electromagnetic Susceptibility of low frequency bipolar transistors subject to the total ionizing dose effect. EMC Compo, Nov 2011, Dubrovnik, Croatia. ⟨hal-01893981⟩