Advances in electric charge measurements in semi-conducting structures by non-destructive thermal methods

Sylvain Baudon , Petru Jr. Notingher (1, 2) , Serge Agnel (1, 2) , Stéphane Holé (3)

1 IES - Institut d’Electronique et des Systèmes
2 GEM - Groupe énergie et matériaux
3 LPEM - Laboratoire de Physique et d'Etude des Matériaux (UMR 8213)

Domaines: Electronique

Sylvain Baudon, Petru Jr. Notingher, Serge Agnel, Stéphane Holé. Advances in electric charge measurements in semi-conducting structures by non-destructive thermal methods. 2014 IEEE Industry Applications Society Annual Meeting, Oct 2014, Vancouver, France. ⟨10.1109/IAS.2014.6978355⟩. ⟨hal-01762827⟩