Single-Event Upsets in Substrate-Etched CMOS SOI SRAMs Using Ultraviolet Optical Pulses With Sub-Micrometer Spot Size

Dale Mcmorrow (1) , Ani Khachatrian (2) , Nicolas J.-H. Roche (3, 4) , Jeffrey H. Warner (1) , Stephen P. Buchner (5) , Nderitu Kanyogoro (2) , Joseph S. Melinger (1) , Vincent Pouget (3, 6) , Camille Larue (7) , Alan Hurst , Dan Kagey

1 NRL - Naval Research Laboratory
2 Sotera Defence
3 IES - Institut d’Electronique et des Systèmes
4 Washington University
5 GSFC - NASA Goddard Space Flight Center
6 RADIAC - Radiations et composants
7 LEFE - Laboratoire Ecologie Fonctionnelle et Environnement

Domaines: Electronique

Dale Mcmorrow, Ani Khachatrian, Nicolas J.-H. Roche, Jeffrey H. Warner, Stephen P. Buchner, et al.. Single-Event Upsets in Substrate-Etched CMOS SOI SRAMs Using Ultraviolet Optical Pulses With Sub-Micrometer Spot Size. IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4184 - 4191. ⟨10.1109/TNS.2013.2290307⟩. ⟨hal-01633902⟩