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Communication Dans Un Congrès Année : 2016

Mesoporous germanium by high frequency bipolar electrochemical etching for optical sensor applications

Résumé

Mesoporous germanium layers (MP-Ge) were prepared with high growth rate (up to 300 nm/min) by using a new high-current-density, high-frequency bipolar electrochemical etching (BEE) process. The potential of porous semiconductor layers for optical sensing has been assessed by examining the resonance wavelength shift in the reflectance spectra before and after infiltration of ethanol.

Domaines

Matériaux
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Dates et versions

hal-01565497 , version 1 (19-07-2017)

Identifiants

  • HAL Id : hal-01565497 , version 1

Citer

Youcef A Bioud, Abderraouf A Boucherif, Ali A Belarouci, Etienne A Paradis, Dominique A Drouin, et al.. Mesoporous germanium by high frequency bipolar electrochemical etching for optical sensor applications. Porous Semiconductors - Science and Technology (PSST) Conference, Mar 2016, Tarragona, Spain. ⟨hal-01565497⟩
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