Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films

Jean-Marc Tonnerre (1) , Nicolas Jaouen (2) , E. Bontempi (3) , D. Carbone (3) , David Babonneau (4) , Maurizio de Santis (1) , Hélio Tolentino (5) , Stéphane Grenier (6) , Stéphanie Garaudée (7) , Urs Staub (8)

1 NEEL - SIN - Surfaces, Interfaces et Nanostructures
2 SSOLEIL - Synchrotron SOLEIL
3 UniBs - Università degli Studi di Brescia = University of Brescia
4 LMP - Laboratoire de métallurgie physique
5 NEEL - CRG - CRG & Grands instruments
6 NEEL - MRS - Matériaux, Rayonnements, Structure
7 NEEL- EpiCM - Epitaxie et couches minces
8 SLS-PSI - The Swiss Light Source (SLS)

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Jean-Marc Tonnerre, Nicolas Jaouen, E. Bontempi, D. Carbone, David Babonneau, et al.. Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films. Journal of Physics: Conference Series, 2010, 211, pp.012015. ⟨10.1088/1742-6596/211/1/012015⟩. ⟨hal-01002194⟩