Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study

A. Diaz (1, 2) , Virginie Chamard (3) , C. Mocuta (4) , Rogerio Magalhães-Paniago (1) , J. Stangl (2) , D. Carbone (1) , T.H. Metzger (1) , G. Bauer

1 ESRF - European Synchrotron Radiation Facility
2 JKU - University of Linz - Johannes Kepler Universität Linz
3 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
4 SSOLEIL - Synchrotron SOLEIL

We investigate the feasibility of applying coherent diffraction imaging to highly strained epitaxial nanocrystals using finite-element simulations of SiGe islands as input in standard phase retrieval algorithms. We discuss the specific problems arising from both epitaxial and highly strained systems and we propose different methods to overcome these difficulties. Finally, we describe a coherent microdiffraction experimental setup using extremely focused x-ray beams to perform experiments on individual nanostructures.

Domains: Optics [physics.optics]; Optics / Photonic; Signal and Image processing

A. Diaz, Virginie Chamard, C. Mocuta, Rogerio Magalhães-Paniago, J. Stangl, et al.. Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study. New Journal of Physics, 2010, 12, pp.035006. ⟨10.1088/1367-2630/12/3/035006⟩. ⟨hal-00942788⟩