Subpixel determination of imperfect circles characteristics

Fabrice Mairesse; Tadeusz Sliwa; Stéphane Binczak; Yvon Voisin

doi:10.1016/j.patcog.2007.03.010

Journal Articles Pattern Recognition Year : 2008

Subpixel determination of imperfect circles characteristics

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1

Fabrice Mairesse

Function : Author
PersonId : 935521

Laboratoire Electronique, Informatique et Image [UMR6306]

Tadeusz Sliwa

Function : Author

Laboratoire Electronique, Informatique et Image [UMR6306]

Stéphane Binczak

Function : Author
PersonId : 12398
IdHAL : amar-zeher

Laboratoire Electronique, Informatique et Image [UMR6306]

Yvon Voisin

Function : Author
PersonId : 913146

Laboratoire Electronique, Informatique et Image [UMR6306]

Keywords

Discrete circles Geometric noise Radon transform Model fitting Active contours

Domains

Image Processing [eess.IV]

Fabrice Mairesse : Connect in order to contact the contributor

https://hal.science/hal-00771253

Submitted on : Tuesday, January 8, 2013-11:47:46 AM

Last modification on : Friday, April 26, 2024-2:04:17 PM

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hal-00771253 , version 1 (08-01-2013)

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HAL Id : hal-00771253 , version 1
DOI : 10.1016/j.patcog.2007.03.010

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Fabrice Mairesse, Tadeusz Sliwa, Stéphane Binczak, Yvon Voisin. Subpixel determination of imperfect circles characteristics. Pattern Recognition, 2008, 41 (1), pp.250-271. ⟨10.1016/j.patcog.2007.03.010⟩. ⟨hal-00771253⟩

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Subpixel determination of imperfect circles characteristics

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