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Study of nano-domains by piezoresponse force microscopy of relaxor PMN-PT thin films : influence of the annealing temperature, film thickness and composition

M. Detalle R. Liang Caroline Soyer Denis Remiens 1 X. Dong 
1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
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Conference papers
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https://hal.archives-ouvertes.fr/hal-00575749
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Submitted on : Friday, March 11, 2011 - 9:22:22 AM
Last modification on : Wednesday, March 23, 2022 - 3:50:24 PM

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  • HAL Id : hal-00575749, version 1

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CNRS | UNIV-VALENCIENNES | IEMN | UNIV-LILLE

Citation

M. Detalle, R. Liang, Caroline Soyer, Denis Remiens, X. Dong. Study of nano-domains by piezoresponse force microscopy of relaxor PMN-PT thin films : influence of the annealing temperature, film thickness and composition. European Materials Research Society Spring Meeting, E-MRS Spring 2009, Symposium H : Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films II, 2009, Strasbourg, France. ⟨hal-00575749⟩

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