Calculating Kelvin force microscopy signals from static force fields
Résumé
We present an analytical formula to achieve numerical simulations of Kelvin force microscopy
KFM signals from static force fields, which can be employed to describe amplitude-modulation or
frequency-modulation KFM, as well as simultaneous topography and KFM modes for which the tip
probe exhibits a nonzero oscillation during KFM imaging. This model is shown to account for
side-capacitance and nonlinear effects taking place in KFM experiments, and can therefore be used
conveniently to extract quantitative information from KFM experiments at the nanoscale
Domaines
Sciences de l'ingénieur [physics]
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