X-ray microtomography imaging of Ti-SiC composites

Sa Mcdonald; M. Preuss; Eric Maire; Jean-Yves Buffiere; Pm Mummery; P.J. Withers

Journal Articles Journal of Microscopy Year : 2003

X-ray microtomography imaging of Ti-SiC composites

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Sa Mcdonald

Function : Author

M. Preuss

Function : Author

Eric Maire

Function : Author
PersonId : 14151
IdHAL : eric-maire-mateis
ORCID : 0000-0003-1952-2602
IdRef : 081232314

Matériaux, ingénierie et science [Villeurbanne]

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Jean-Yves Buffiere

Function : Author
PersonId : 16742
IdHAL : jybuffiere
ORCID : 0000-0001-7319-3606
IdRef : 081232055

Matériaux, ingénierie et science [Villeurbanne]

Pm Mummery

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P.J. Withers

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https://hal.science/hal-00475151

Submitted on : Wednesday, April 21, 2010-11:38:19 AM

Last modification on : Friday, March 24, 2023-2:52:53 PM

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hal-00475151 , version 1 (21-04-2010)

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HAL Id : hal-00475151 , version 1

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Sa Mcdonald, M. Preuss, Eric Maire, Jean-Yves Buffiere, Pm Mummery, et al.. X-ray microtomography imaging of Ti-SiC composites. Journal of Microscopy, 2003, pp.112. ⟨hal-00475151⟩

X-ray microtomography imaging of Ti-SiC composites

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