A two-step procedure for characterizing obstacles under a rough surface from bistatic measurements

Abstract : A two-step electromagnetic detection procedure is proposed to characterize a dielectric obstacle buried at low depth under a rough surface from single-frequency and multistatic data. First, we have developed, in the framework of the small perturbation theory, a correlation procedure of the scattered field, which enables us to recover an estimation of the roughness profile. This method is tested for various cases with synthetic data provided by a rigorous boundary integral solver. Second, the obtained surface profile is introduced into the numerical simulation thanks to a finite-element code. An iterative process is then used, based on a level-set formulation, to obtain the shape of the buried target. The influence of the prior step on the accuracy of the reconstruction of the target is studied via various criteria and for different configurations.
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Article dans une revue
IEEE Transactions on Geoscience and Remote Sensing, Institute of Electrical and Electronics Engineers, 2007, 45 (9), pp.2850 - 2858. 〈10.1109/TGRS.2007.902289〉
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https://hal.archives-ouvertes.fr/hal-00438258
Contributeur : Amelie Litman <>
Soumis le : jeudi 3 décembre 2009 - 10:19:27
Dernière modification le : lundi 4 mars 2019 - 14:04:24

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Octavien Cmielewski, Hervé Tortel, Amelie Litman, Marc Saillard. A two-step procedure for characterizing obstacles under a rough surface from bistatic measurements. IEEE Transactions on Geoscience and Remote Sensing, Institute of Electrical and Electronics Engineers, 2007, 45 (9), pp.2850 - 2858. 〈10.1109/TGRS.2007.902289〉. 〈hal-00438258〉

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