Thin film materials characterization using TE modes cavity

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Journal articles
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https://hal.archives-ouvertes.fr/hal-00411872
Contributor : Sandrine Nogues <>
Submitted on : Monday, August 31, 2009 - 9:30:57 AM
Last modification on : Thursday, October 24, 2019 - 3:46:04 PM

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Jean-Michel Le Floch, Fiffamen Houndonougbo, Valérie Madrangeas, Dominique Cros, Maryline Guilloux-Viry, et al.. Thin film materials characterization using TE modes cavity. Journal of Electromagnetic Waves and Applications, Taylor & Francis, 2009, 23 (4), pp.549-559. ⟨10.1163/156939309787612293⟩. ⟨hal-00411872⟩

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