Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

Philippe Perdu; Dean Lewis; V. Pouget

Conference Papers Year : 2008

Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

(1) , (2) , (2)

1
2

Philippe Perdu

Function : Author
PersonId : 839676

Centre National d'Études Spatiales [Toulouse]

Dean Lewis

Function : Author

Laboratoire de l'intégration, du matériau au système

V. Pouget

Function : Author
PersonId : 21573
IdHAL : vincent-pouget
ORCID : 0000-0001-6126-6708
IdRef : 060649313

Laboratoire de l'intégration, du matériau au système

Domains

Electronics

Frédéric Darracq : Connect in order to contact the contributor

https://hal.science/hal-00401385

Submitted on : Friday, July 3, 2009-7:56:05 AM

Last modification on : Monday, June 5, 2023-4:52:11 PM

Dates and versions

hal-00401385 , version 1 (03-07-2009)

Identifiers

HAL Id : hal-00401385 , version 1

Cite

Philippe Perdu, Dean Lewis, V. Pouget. Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges. European Symposium on Reliability of Electron Devices (ESREF), 2008, Maastricht, Netherlands. ⟨hal-00401385⟩

Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

Domains

Dates and versions

Identifiers

Cite

Export

Collections

Share