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Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

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https://hal.archives-ouvertes.fr/hal-00401385
Contributor : Frédéric Darracq <>
Submitted on : Friday, July 3, 2009 - 7:56:05 AM
Last modification on : Thursday, July 25, 2019 - 4:34:15 PM

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  • HAL Id : hal-00401385, version 1

Citation

Philippe Perdu, Dean Lewis, V. Pouget. Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges. European Symposium on Reliability of Electron Devices (ESREF), 2008, Maastricht, Netherlands. ⟨hal-00401385⟩

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