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Journal articles

Resistivity and surface states density of n and p type silicon nanowires

Francois Vaurette J.P. Nys D. Deresmes B. Grandidier D. Stiévenard 1
1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
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Submitted on : Friday, January 30, 2009 - 11:12:42 AM
Last modification on : Wednesday, March 23, 2022 - 3:50:21 PM

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IEMN | CNRS | UNIV-LILLE | UNIV-VALENCIENNES

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Francois Vaurette, J.P. Nys, D. Deresmes, B. Grandidier, D. Stiévenard. Resistivity and surface states density of n and p type silicon nanowires. Journal of Vacuum Science and Technology B, 2008, 26, pp.945-948. ⟨10.1116/1.2908438⟩. ⟨hal-00357381⟩

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