Neutron-induced SEU in bulk SRAMs in terrestrial environment: simulations and experiments

D. Lambert (1) , J. Baggio (2) , V. Ferlet-Cavrois (2) , O. Flament , J.-M. Palau (1) , Frédéric Saigné (1) , B. Sagnes (1) , T. Carrière

1 CEM2 - Centre d'Electronique et de Micro-optoélectronique de Montpellier
2 DAM/DIF - DAM Île-de-France

This work investigates the sensitivity of bulk technologies in the terrestrial neutron environment as a function of technology scaling. Their sensitivity is analyzed with both experiments and Monte Carlo simulations. The soft error rate (SER) of future technology generations is extrapolated, analyzed and discussed on the basis of different parameters such as the interaction volume, the secondary ion species and the incident neutron energy ranges.

Domaines: Electronique

D. Lambert, J. Baggio, V. Ferlet-Cavrois, O. Flament, J.-M. Palau, et al.. Neutron-induced SEU in bulk SRAMs in terrestrial environment: simulations and experiments. IEEE Transactions on Nuclear Science, 2004, 51 (6), pp.3435-3441. ⟨10.1109/TNS.2004.839133⟩. ⟨hal-00330001⟩