MMIC's characterization by very near-field technique

L. Nativel (1) , Mario Marchetti , P. Falgayrettes (1) , M. Castagné (1) , D. Gasquet (1) , P. Gall-Borrut (1) , M. Castel (1)

1 CEM2 - Centre d'Electronique et de Micro-optoélectronique de Montpellier

This paper shows a method to characterize microwave circuits using a near-field scanning microscope. Applied of various samples, it shows good resolution and weak disturbance for ICs operating with very common microwave components. Here, it is applied in an industrial surd rounding to characterize the Bluetooth CMOS power amplifier.

Mots clés: very near-field measurements; high-resolution imaging; MMICs EMC; PLANAR MICROWAVE CIRCUITS; PROBES; RESOLUTION; GHZ

Domaines: Electronique

L. Nativel, Mario Marchetti, P. Falgayrettes, M. Castagné, D. Gasquet, et al.. MMIC's characterization by very near-field technique. Microwave and Optical Technology Letters, 2004, 41 (3), pp.209-213. ⟨10.1002/mop.20096⟩. ⟨hal-00322104⟩