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Conference papers

Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM

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Conference papers
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https://hal.archives-ouvertes.fr/hal-00285229
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Submitted on : Thursday, June 5, 2008 - 9:16:37 AM
Last modification on : Wednesday, March 23, 2022 - 3:50:21 PM

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  • HAL Id : hal-00285229, version 1

Citation

S. Lenfant, D. Deresmes, D. Vuillaume. Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM. Matériaux et Nanostructures Pi-Conjugués, MNPC07, 2007, Le Grau du Roi, France. ⟨hal-00285229⟩

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