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Conference papers

Evidence of traps creation in GaN/AlGaN/GaN HEMTs after a 3000 hours on-state and off-state hot-electron stress

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Conference papers
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https://hal.archives-ouvertes.fr/hal-00126762
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Submitted on : Friday, January 26, 2007 - 9:53:00 AM
Last modification on : Tuesday, October 19, 2021 - 6:37:47 PM

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  • HAL Id : hal-00126762, version 1

Citation

A. Sozza, C. Dua, E. Morvan, M.A. Poisson, S. Delage, et al.. Evidence of traps creation in GaN/AlGaN/GaN HEMTs after a 3000 hours on-state and off-state hot-electron stress. 2005, 4 pp. ⟨hal-00126762⟩

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