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Article Dans Une Revue Applied Physics Letters Année : 2007

Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature

Julien Senzier
  • Fonction : Auteur
Pengshun S. Luo
  • Fonction : Auteur

Résumé

We demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60 mK). This local probe uses a quartz tuning fork ensuring high tunnel junction stability. We performed the spatially-resolved spectroscopic study of a superconducting nano-circuit patterned on an insulating substrate. Significant deviations from the BCS prediction are observed.
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Dates et versions

hal-00106410 , version 1 (15-10-2006)
hal-00106410 , version 2 (28-03-2007)

Identifiants

Citer

Julien Senzier, Pengshun S. Luo, Hervé Courtois. Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature. Applied Physics Letters, 2007, 90 (4), pp.043114. ⟨10.1063/1.2436651⟩. ⟨hal-00106410v2⟩

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