HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Journal articles

Full field electron spectromicroscopy applied to ferroelectric materials

Abstract : The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structures of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons, whereas LEEM images reflected and elastically backscattered electrons. Both PEEM and LEEM can be used in direct and reciprocal space imaging. Together, they provide access to surface charge, work function, topography, chemical mapping, surface crystallinity, and band structure. Examples of applications for the study of ferroelectric thin films and single crystals are presented.
Document type :
Journal articles
Complete list of metadata

Contributor : Dominique Girard Connect in order to contact the contributor
Submitted on : Monday, February 27, 2017 - 3:23:29 PM
Last modification on : Monday, April 4, 2022 - 10:40:40 AM

Links full text



N. Barrett, J. E. Rault, L. Wang, C. Mathieu, A. Locatelli, et al.. Full field electron spectromicroscopy applied to ferroelectric materials. Journal of Applied Physics, American Institute of Physics, 2013, 113 (18), ⟨10.1063/1.4801968⟩. ⟨cea-01477631⟩



Record views