TCAD Simulations of Leakage Currents Induced by SDRAM Single-Event Cell Degradation

A. Rodriguez , Frédéric Wrobel (1, 2) , A. Michez (1, 2) , Antoine Touboul (1, 2) , F. Bezerra , R. Ecoffet (3) , E. Lorfèvre (3) , F. Saigné (1, 2)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 CNES - Centre National d'Études Spatiales [Toulouse]

Domaines: Electronique

A. Rodriguez, Frédéric Wrobel, A. Michez, Antoine Touboul, F. Bezerra, et al.. TCAD Simulations of Leakage Currents Induced by SDRAM Single-Event Cell Degradation. IEEE RADECS 2016, 2016, Brême, Germany. ⟨hal-01824785⟩