METHODOLOGIES DE TEST DEIEES AUX MEMOIRES EMBARQUEES

Hassen Aziza

Habilitation À Diriger Des Recherches Year : 2012

METHODOLOGIES DE TEST DEIEES AUX MEMOIRES EMBARQUEES

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Hassen Aziza

Function : Author
PersonId : 177966
IdHAL : azizah
ORCID : 0000-0002-8278-7462
IdRef : 085275581

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

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Keywords

Test Memory Emerging Memory Embedded Memory ReRAM RRAM OxRAM

Mémoires embraquées ReRAM RRAM OxRAM Test Mémoires électroniques Mémoires émergentes

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Micro and nanotechnologies/Microelectronics

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HDR_AZIZA_FINAL_HAL.pdf (34.86 Mo)

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HASSAN AZIZA : Connect in order to contact the contributor

https://hal.science/tel-03139646

Submitted on : Tuesday, February 16, 2021-5:56:53 PM

Last modification on : Friday, May 17, 2024-1:54:03 PM

Dates and versions

tel-03139646 , version 1 (12-02-2021)

tel-03139646 , version 2 (16-02-2021)

tel-03139646 , version 3 (22-12-2021)

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HAL Id : tel-03139646 , version 2

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Hassen Aziza. METHODOLOGIES DE TEST DEIEES AUX MEMOIRES EMBARQUEES. Micro et nanotechnologies/Microélectronique. Aix Marseille Université (AMU), 2012. ⟨tel-03139646v2⟩

METHODOLOGIES DE TEST DEIEES AUX MEMOIRES EMBARQUEES

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