NAND Flash Testing: A Preliminary Study on Actual Defects

Pierre-Didier Mauroux (1) , Arnaud Virazel (2) , Alberto Bosio (2) , Luigi Dilillo (2) , Patrick Girard (2) , Serge Pravossoudovitch (2) , Benoît Godard (3)

1 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
3 ATMEL - Atmel Corporation

Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.

Domaines: Micro et nanotechnologies/Microélectronique

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. NAND Flash Testing: A Preliminary Study on Actual Defects. ITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩. ⟨lirmm-00433765⟩