March iC-: An Improved Version of March C- for ADOFs Detection

Luigi Dilillo (1) , Patrick Girard (1) , Serge Pravossoudovitch (1) , Arnaud Virazel (1) , Simone Borri (2)

1 SysMIC - Conception et Test de Systèmes MICroélectroniques
2 INFINEON - SOPHIA - Infineon Technologies France

This paper presents a new March test solution for detection of ADOFs (Address Decoder Open Faults), and resistive-ADOFs that are the consequence of resistive-open defects in address decoders of SRAM memories. In this study, we briefly analyze the test conditions and the March test requirements for these particular faults and we introduce some modifications to the well known March C- making it able to detect ADOFs and resistive-ADOFs, without increasing its complexity and its ability to detect the former target faults. The reformulation of March C-, called March iC-, is essentially based on introducing a particular address sequence and a particular read/write data sequence. The proposed March iC- extends the ability of March-based test solutions in detecting dynamic faults in SRAM memories.

Domaines: Micro et nanotechnologies/Microélectronique

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri. March iC-: An Improved Version of March C- for ADOFs Detection. VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.129-134, ⟨10.1109/VTEST.2004.1299236⟩. ⟨lirmm-00108772⟩