High accuracy position response calibration method for a micro-channel plate ion detector
Résumé
We have developed a position response calibration method for a micro-channel plate (MCP) detector with a delay-line anode position readout scheme. Using an {\em in situ} calibration mask, an accuracy of 8~$\mu$m and a resolution of 85~$\mu$m (FWHM) have been achieved for MeV-scale $\alpha$ particles and ions with energies of $\sim$10~keV. For high statistics experiments, this method can be directly employed with the experimental data without any dedicated calibration runs. The improved performance of the MCP detector can find applications in many fields of AMO and nuclear physics. In our case, it helps reducing systematic uncertainties in a high-precision nuclear $\beta$-decay experiment.