Coherent x-ray scattering in an XPEEM setup

T.O. Menteş (1) , F. Genuzio (1) , V. Schánilec (2) , J. Sadílek (3) , Nicolas Rougemaille (2) , A. Locatelli (1)

1 Elettra Sincrotrone Trieste
2 NEEL - MNM - Micro et NanoMagnétisme
3 BUT - Brno University of Technology [Brno]

X-ray photoemission electron microscopy has been one of the most productive x-ray microscopy tools with chemical and magnetic sensitivity. We demonstrate that an existing XPEEM setup can be readily adapted to simultaneously perform coherent x-ray scattering measurements in reflectivity mode. Photon-in photon-out x-ray scattering measurement provides the sensitivity to buried interfaces as well as the possibility to work under external fields not accessible in an electron-based measurement. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for a spin-ice lattice showing both chemical and magnetic contrast.

Mots clés: XPEEM; speckle; CDI; reconstruction; resonant x-ray scattering; LEEM

Domaines: Science des matériaux [cond-mat.mtrl-sci]

T.O. Menteş, F. Genuzio, V. Schánilec, J. Sadílek, Nicolas Rougemaille, et al.. Coherent x-ray scattering in an XPEEM setup. Ultramicroscopy, 2020, 216, pp.113035. ⟨10.1016/j.ultramic.2020.113035⟩. ⟨hal-02963798⟩