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Article Dans Une Revue Journal of Synchrotron Radiation Année : 2019

Overcoming the challenges of high-energy X-ray ptychography

Résumé

X-ray ptychography is a coherent diffraction imaging technique with a high resolving power and excellent quantitative capabilities. Although very popular in synchrotron facilities nowadays, its implementation with X-ray energies above 15 keV is very rare due to the challenges imposed by the high energies. Here, the implementation of high-energy X-ray ptychography at 17 and 33.6 keV is demonstrated and solutions to overcome the important challenges are provided. Among the particular aspects addressed are the use of an efficient high-energy detector, a long synchrotron beamline for the high degree of spatial coherence, a beam with 1% monochromaticity providing high flux, and efficient multilayer coated Kirkpatrick-Baez X-ray optics to shape the beam. The constraints imposed by the large energy bandwidth are carefully analyzed, as well as the requirements to sample correctly the high-energy diffraction patterns with small speckle size. In this context, optimized scanning trajectories allow the total acquisition time to be reduced by up to 35%. The paper explores these innovative solutions at the ID16A nano-imaging beamline by ptychographic imaging of a 200 nm-thick gold lithography sample.
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Dates et versions

hal-02612387 , version 1 (19-05-2020)

Identifiants

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Julio Cesar da Silva, Cyril Guilloud, Olivier Hignette, Christophe Jarnias, Cyril Ponchut, et al.. Overcoming the challenges of high-energy X-ray ptychography. Journal of Synchrotron Radiation, 2019, 26 (5), pp.1751-1762. ⟨10.1107/S1600577519006301⟩. ⟨hal-02612387⟩

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