Area downsizing effects on electrical performance and robustness of triple junction solar cells for CPV applications

Pierre Albert, (1, 2) , Abdelatif Jaouad (2, 1) , Maite Volatier (2, 1) , Christopher E. Valdivia (3) , Yannick Deshayes (4) , Laurent Bechou (4) , Vincent Aimez. (2, 1) , Maxime Darnon (1, 2)

1 3IT - Institut Interdisciplinaire d'Innovation Technologique [Sherbrooke]
2 LN2 - Laboratoire Nanotechnologies Nanosystèmes
3 uOttawa - Université d'Ottawa [Ontario]
4 IMS - Laboratoire de l'intégration, du matériau au système

Domaines: Micro et nanotechnologies/Microélectronique

Pierre Albert,, Abdelatif Jaouad, Maite Volatier, Christopher E. Valdivia, Yannick Deshayes, et al.. Area downsizing effects on electrical performance and robustness of triple junction solar cells for CPV applications. International Symposium on Reliability of Optoelectronics System, Nov 2019, Toulouse, France. ⟨hal-02443117⟩