Skip to Main content Skip to Navigation
Conference papers

Deep learning-based speckle decorrelation denoising for wide-field optical metrology

Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-02434956
Contributor : Marie Tahon <>
Submitted on : Friday, January 10, 2020 - 2:31:26 PM
Last modification on : Tuesday, June 23, 2020 - 3:11:11 PM

Identifiers

  • HAL Id : hal-02434956, version 1

Collections

Citation

Silvio Montrésor, Marie Tahon, Antoine Laurent, Pascal Picart. Deep learning-based speckle decorrelation denoising for wide-field optical metrology. Optics and Photonics for Advanced Dimensional Metrology, International Society for Optics and Photonics (SPIE), Apr 2020, Strasbourg, France. ⟨hal-02434956⟩

Share

Metrics

Record views

128