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Conference papers

Deep learning-based speckle decorrelation denoising for wide-field optical metrology

Silvio Montrésor 1 Marie Tahon 2 Antoine Laurent 2 Pascal Picart 1 
1 LAUM - Laboratoire d'Acoustique de l'Université du Mans
2 LIUM - Laboratoire d'Informatique de l'Université du Mans
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Conference papers
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https://hal.archives-ouvertes.fr/hal-02434956
Contributor : Marie Tahon Connect in order to contact the contributor
Submitted on : Friday, January 10, 2020 - 2:31:26 PM
Last modification on : Wednesday, September 22, 2021 - 11:26:06 AM

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  • HAL Id : hal-02434956, version 1

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CNRS | UNIV-LEMANS | LIUM | LIUM-LST | LAUM

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Silvio Montrésor, Marie Tahon, Antoine Laurent, Pascal Picart. Deep learning-based speckle decorrelation denoising for wide-field optical metrology. Optics and Photonics for Advanced Dimensional Metrology, International Society for Optics and Photonics (SPIE), Apr 2020, Strasbourg, France. ⟨hal-02434956⟩

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