Skip to Main content Skip to Navigation
Conference papers

Deep learning-based speckle decorrelation denoising for wide-field optical metrology

Complete list of metadata

https://hal.archives-ouvertes.fr/hal-02434956
Contributor : Marie Tahon Connect in order to contact the contributor
Submitted on : Friday, January 10, 2020 - 2:31:26 PM
Last modification on : Wednesday, September 22, 2021 - 11:26:06 AM

Identifiers

  • HAL Id : hal-02434956, version 1

Collections

Citation

Silvio Montrésor, Marie Tahon, Antoine Laurent, Pascal Picart. Deep learning-based speckle decorrelation denoising for wide-field optical metrology. Optics and Photonics for Advanced Dimensional Metrology, International Society for Optics and Photonics (SPIE), Apr 2020, Strasbourg, France. ⟨hal-02434956⟩

Share

Metrics

Record views

114