Deep learning-based speckle decorrelation denoising for wide-field optical metrology

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https://hal.archives-ouvertes.fr/hal-02434956
Contributor : Marie Tahon <>
Submitted on : Friday, January 10, 2020 - 2:31:26 PM
Last modification on : Thursday, January 23, 2020 - 10:53:30 AM

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Silvio Montrésor, Marie Tahon, Antoine Laurent, Pascal Picart. Deep learning-based speckle decorrelation denoising for wide-field optical metrology. SPIE Photonics Europe International Symposium, Mar 2020, Strasbourg, France. ⟨hal-02434956⟩

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