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Conference papers
Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP
Abstract : In this paper, we propose a defect-oriented Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/M-S) Integrated Circuits (ICs), called symmetry-based BIST (Sym-BIST). SymBIST exploits inherent symmetries into the design to generate invariances that should hold true only in defect-free operation. Violation of any of these invariances points to defect detection. We demonstrate SymBIST on a 65nm 10-bit Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) IP by ST Microelectronics.
Cited literature [14 references]
https://hal.archives-ouvertes.fr/hal-02385120
Contributor : Haralampos Stratigopoulos <>
Submitted on : Thursday, November 28, 2019 - 4:24:09 PM
Last modification on : Friday, January 8, 2021 - 5:34:03 PM
Long-term archiving on: : Saturday, February 29, 2020 - 6:34:03 PM
Contributor : Haralampos Stratigopoulos <>
Submitted on : Thursday, November 28, 2019 - 4:24:09 PM
Last modification on : Friday, January 8, 2021 - 5:34:03 PM
Long-term archiving on: : Saturday, February 29, 2020 - 6:34:03 PM
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