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Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP

Abstract : In this paper, we propose a defect-oriented Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/M-S) Integrated Circuits (ICs), called symmetry-based BIST (Sym-BIST). SymBIST exploits inherent symmetries into the design to generate invariances that should hold true only in defect-free operation. Violation of any of these invariances points to defect detection. We demonstrate SymBIST on a 65nm 10-bit Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) IP by ST Microelectronics.
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Submitted on : Thursday, November 28, 2019 - 4:24:09 PM
Last modification on : Sunday, June 26, 2022 - 2:43:48 AM
Long-term archiving on: : Saturday, February 29, 2020 - 6:34:03 PM


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Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. Stratigopoulos. Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP. Design, Automation and Test in Europe Conference, Mar 2020, Grenoble, France. ⟨10.23919/DATE48585.2020.9116189⟩. ⟨hal-02385120⟩



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