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Reconstruction of partially sampled EELS images

Abstract : Electron microscopy has shown to be a very powerful tool to deeply analyze the chemical composition at various scales. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the radiation damage induced by the electron beam. Particularly, electron energy loss spectroscopy (EELS) which acquires a spectrum for each spatial position requires high beam intensity. Scanning transmission electron microscopes (STEM) sequentially acquire data cubes by scanning the electron probe over the sample and record a spectrum for each spatial position. Recent works developed new acquisition procedures, which allow for partial acquisition schemes following a predetermined scan pattern. A reconstruction of the full data cube is conducted as a post-processing step. A multi-band image reconstruction procedure which exploits the spectral structure and the spatial smoothness of STEM-EELS images is explained here. The performance of the proposed scheme is illustrated thanks to experiments conducted on a realistic phantom dataset as well as real EELS spectrum-image.
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Submitted on : Tuesday, September 17, 2019 - 11:58:34 AM
Last modification on : Wednesday, June 9, 2021 - 10:00:28 AM
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Etienne Monier, Thomas Oberlin, Nathalie Brun, Maria de Frutos, Marcel Tencé, et al.. Reconstruction of partially sampled EELS images. 9th IEEE Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS 2018), Sep 2018, Amsterdam, Netherlands. ⟨10.1109/WHISPERS.2018.8747104⟩. ⟨hal-02289995⟩



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