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Article Dans Une Revue Beilstein Journal of Nanotechnology Année : 2018

Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation

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Benjamin GREVIN  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-02277091

Soumis le : mardi 3 septembre 2019-13:29:55

Dernière modification le : jeudi 11 avril 2024-13:08:15

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hal-02277091 , version 1 (03-09-2019)

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Pablo Fernández Garrillo, Benjamin Grevin, Łukasz Borowik. Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation. Beilstein Journal of Nanotechnology, 2018, 9, pp.1834-1843. ⟨10.3762/bjnano.9.175⟩. ⟨hal-02277091⟩

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