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Calibrated work function mapping by Kelvin probe force microscopy

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https://hal.archives-ouvertes.fr/hal-02277068
Contributor : Benjamin Grevin <>
Submitted on : Tuesday, September 3, 2019 - 1:16:18 PM
Last modification on : Tuesday, May 26, 2020 - 11:46:03 AM

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Pablo Fernández Garrillo, Benjamin Grevin, Nicolas Chevalier, Łukasz Borowik. Calibrated work function mapping by Kelvin probe force microscopy. Review of Scientific Instruments, American Institute of Physics, 2018, 89 (4), pp.043702. ⟨10.1063/1.5007619⟩. ⟨hal-02277068⟩

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