Characterization and Modelling of High Speed Ge Photodetectors Reliability

F. Sy (1) , Q. Rafhay (1) , J. Poëtte (1) , G. Grosa (1) , C. Besset , G. Beylier (1) , P. Grosse (2) , D. Roy (3) , J.-E. Broquin (1)

1 IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation
2 DOPT - Département d'Optronique
3 ST-CROLLES - STMicroelectronics [Crolles]

Domaines: Optique / photonique

F. Sy, Q. Rafhay, J. Poëtte, G. Grosa, C. Besset, et al.. Characterization and Modelling of High Speed Ge Photodetectors Reliability. 2019 IEEE International Reliability Physics Symposium (IRPS), Mar 2019, Monterey, United States. pp.1-5. ⟨hal-02274432⟩