Using stresses obtained from a low detailed FE model and located at a reference point to quickly calculate the free-edge stress intensity factors of bonded joints

Abstract : The present study focuses on methods allowing a convenient and quick calculation of the SIFs in order to predict the static adhesive strength of bonded joints. A new SIF calculation method is proposed, based on the stresses obtained from a FE model at a reference point located in the adhesive layer at equal distance of the free-edge and of the two interfaces. It is shown that, even limiting ourselves to the two main modes, i.e. the opening and the shearing modes, and using the values of the stresses resulting from a low detailed FE model, an efficient calculation of the peeling stress at adhesive-substrate corners can be obtained by this way. The proposed method is interesting in that it can be the basis of a prediction tool that will allow the designer to quickly evaluate the SIFs characterizing a particular application without developing a detailed analysis.
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Contributor : Pierre Naegelen <>
Submitted on : Thursday, July 25, 2019 - 2:09:05 PM
Last modification on : Tuesday, October 22, 2019 - 5:20:45 PM

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  • HAL Id : hal-02194346, version 1

Citation

F. Maamar, Marc Sartor. Using stresses obtained from a low detailed FE model and located at a reference point to quickly calculate the free-edge stress intensity factors of bonded joints. ICMIAE 2009 - International Conference on Mechanical, Industrial and Aerospace Engineering, World Congress on Science, Engineering and Technology WCSET 2009, Venice, Italy, October 28-30, 2009, Venice, Italy. Issue 58, p. 244-250. ⟨hal-02194346⟩

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