On the Nature and Recombination Properties of the Defect Responsible for the Carrier-Induced Lifetime Degradation in Uncompensated N-Type Cz Silicon - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2018

On the Nature and Recombination Properties of the Defect Responsible for the Carrier-Induced Lifetime Degradation in Uncompensated N-Type Cz Silicon

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hal-02157692 , version 1 (17-06-2019)

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  • HAL Id : hal-02157692 , version 1

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Elénore Letty, Mohamed-Amine Guerboukha, Jordi Veirman, Wilfried Favre, Mustapha Lemiti. On the Nature and Recombination Properties of the Defect Responsible for the Carrier-Induced Lifetime Degradation in Uncompensated N-Type Cz Silicon. MRS, Nov 2018, Boston, United States. ⟨hal-02157692⟩
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